Nanoeducator II – new <br />generation of educational and <br />Basic research tool<br />Andrew Shubin, <br />VP Marketing...
History and Background<br /><ul><li>20 years on the SPM market
Over 3800 devices in 59 countries
250 experts in HQ offices
 30+distributors worldwide</li></li></ul><li>Our mission<br />“To enablescientists <br />to conduct nanoscaleresearch<br /...
World-wide Distribution<br />
Global Representation<br />NT-MDT Head Office,<br />Moscow, Russia<br />NT-MDT Shanghai<br />Shanghai, China<br />NT-MDT E...
NT-MDT Development, Tempe, Arizona<br />Toaddresstheincreasingactivityof NT-MDT onthe US andworldmarketsofscanningprobemic...
Product Line<br />Price range, Euros<br />
NANOEDUCATOR II<br />New generation<br />of scientific training laboratories<br />for nanotechnology<br />
NANOEDUCATOR II<br />New model advantages<br /><ul><li> AFM head availability
Low noise - High resolution
Fast scanning
New digital controller
 Closed-loop X,Y,Z scanner
Even more easy adjustments</li></li></ul><li>TWO Measuring HEADS<br />Force Probe Head – for educational purposes<br />The...
Technical characteristics<br />
Basic Operation Modes<br />Atomic Force Microscopy (AFM):<br /><ul><li> Topography imaging
 Phase imaging
 Force imaging
 Force spectroscopy
Scanning Tunneling Microscopy (STM):
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Nanoeducator II 2011

Published on: Mar 3, 2016
Published in: Education      
Source: www.slideshare.net


Transcripts - Nanoeducator II 2011

  • 1. Nanoeducator II – new <br />generation of educational and <br />Basic research tool<br />Andrew Shubin, <br />VP Marketing, NT-MDT<br />
  • 2. History and Background<br /><ul><li>20 years on the SPM market
  • 3. Over 3800 devices in 59 countries
  • 4. 250 experts in HQ offices
  • 5. 30+distributors worldwide</li></li></ul><li>Our mission<br />“To enablescientists <br />to conduct nanoscaleresearch<br /> by creating advanced<br />instruments for nanotechnology”<br />Professor Victor Bykov<br />NT-MDTFounder andGeneral Manager<br />
  • 6. World-wide Distribution<br />
  • 7. Global Representation<br />NT-MDT Head Office,<br />Moscow, Russia<br />NT-MDT Shanghai<br />Shanghai, China<br />NT-MDT Europe<br />Eindhoven, NL<br />Representative<br />Offices<br />NT-MDT S&L<br />Limerick, Ireland<br />NT-MDT America<br />Santa Clara, USA<br />
  • 8. NT-MDT Development, Tempe, Arizona<br />Toaddresstheincreasingactivityof NT-MDT onthe US andworldmarketsofscanningprobemicroscopyinstrumentation, thecompanyhas invited theexperienced AFM developersandpractitioneers: Sergei Magonov, John Alexander and Sergey Belikov toformtheresearchunit NT-MDT Developmentin Tempe, Arizona. Thisteam, whichhasacombined SPM experienceofalmost 60 years, willfocusitseffortsondevelopmentandapplications ofnovelmulti-frequency SPM techniques relatedtoquantitativenanomechanicalandelectricmeasurementsofvariousmaterials. ThecompanywillstartoperationsinApril 2011.<br /> Dr. Sergei Magonov was educated in the former USSR where he got his PhD and has conducted research on polymers in the RussianAcademy of Sciences. In 1988 Dr. Magonov moved to Germany (Freiburg University) where he started to apply first scanning tunneling microscopy (STM) and later atomic force microscopy (AFM) to different materials. The scientific results obtained in this period were summarized in the book (written jointly with Prof. M. Whangbo) “Surface Analysis with STM and AFM”, VCH Weinheim 1996. In 1995 Sergei joined Digital Instruments – the leading manufacturer of the scanning probe microscopes where he was involved in development of various AFM applications to soft materials. After spending 12 years with Digital Instruments/Veeco Instruments he moved in 2007 to Agilent Technologies – another manufacturer of scanning probe microscopy, where he was continuing research in AFM. He is the author of 13 chapters/reviews and 175 per-review papers. <br />
  • 9. Product Line<br />Price range, Euros<br />
  • 10. NANOEDUCATOR II<br />New generation<br />of scientific training laboratories<br />for nanotechnology<br />
  • 11. NANOEDUCATOR II<br />New model advantages<br /><ul><li> AFM head availability
  • 12. Low noise - High resolution
  • 13. Fast scanning
  • 14. New digital controller
  • 15. Closed-loop X,Y,Z scanner
  • 16. Even more easy adjustments</li></li></ul><li>TWO Measuring HEADS<br />Force Probe Head – for educational purposes<br />The force-probe is a piezo-tube driven into oscillation by a sinewave voltage applied to two electrodes (inverse piezo-effect) and the oscillation amplitude is measured by the voltage generated across the other two electrodes (direct piezo-effect).<br />AFM head – for the research purposes<br />Semiconductor laser-photodiode registration <br />system<br />
  • 17. Technical characteristics<br />
  • 18. Basic Operation Modes<br />Atomic Force Microscopy (AFM):<br /><ul><li> Topography imaging
  • 19. Phase imaging
  • 20. Force imaging
  • 21. Force spectroscopy
  • 22. Scanning Tunneling Microscopy (STM):
  • 23. Constant Current
  • 24. Constant Height
  • 25. AFM Lithography</li></li></ul><li>Applications:<br />- Biology (cells, viruses, bacteria)<br />- Material science (metals, semiconductors, dielectrics, composition materials, polymers)<br />- Data storage devices (data storage media inspection)<br />- Micro- and nanostructures (gratings, self-organizing systems)<br />
  • 26. Hi resolution possibilities<br />Sample HOPG<br />Scan size 2x2 nm<br />
  • 27. Delivery Set<br /><ul><li> scanning probe microscope
  • 28. handbooks
  • 29. manual
  • 30. demo samples
  • 31. accessories</li></ul>NANOEDUCATOR II <br />can be used in scientific research purposes besides the educational needs<br />
  • 32. Nanoeducator class<br />
  • 33. Student oriented<br /><ul><li>User friendly interface
  • 34. Step-by-step mastering of SPM techniques
  • 35. Clear, animated support
  • 36. Inexpensive consumable materials
  • 37. Simple probe replacement
  • 38. Probe recovery availability</li></li></ul><li>Cutting-Edge Tendencies<br /><ul><li> New updated for operating systems Windows® and Mac® OS
  • 39. Remote control from the teacher’s workstation for entire classroom
  • 40. Various programs for image processing and STM manipulations
  • 41. Data sharing via iPhoneTM</li></ul>and iPadTM<br /><ul><li> Control via Internet</li></li></ul><li>ELECTROCHEMICAL REACTION <br />Observing through the webcam, the tip sharpening action give the students an insight to a common electrochemical process. <br />19<br />The Tip Etching Device <br />The etching process<br />
  • 42. Etching tool<br />
  • 43. Strong client support system<br /><ul><li>Information support
  • 44. After sales service
  • 45. Ask-online service</li></li></ul><li>Thank you!<br />YOU ARE WELCOME TO VISIT OUR BOOTH 959<br />